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MEVIS Draw Tests & DICOM SEG Interoperability

Key Investigators

• Hans Meine
• Steve Pieper
• Erik Ziegler
• James Petts
• Marco Nolden

Project Description

Fraunhofer MEVIS has recently released a standalone annotation tool called “MEVIS draw”: https://s.fhg.de/mevisdraw

MEVIS draw contains a version of the “CSI” tool (“contouring with snapping and interpolation”, while the snapping part is switched off in this application) that aims to provide an intuitive brush editor with nice interpolation features. It also supports a variety of import / export formats.

Objective

• Test MEVIS draw, compare with Slicer / OHIF tools
• Test interoperability w.r.t. import & export, e.g. in DICOM formats

Approach and Plan

• Demo to interested people, collecting feedback & inspiring others
• Test export of segmentation results & import in Slicer

Progress and Next Steps

• Tested inofficial macOS build on Hans’ machine
  • found some tiny usability bug not present on other platforms
  • SEG export did not save any file :-(
• Tested on Windows by Steve
  • SEG export also failed on Windows
  • RTSTRUCT export exported two separate groups of contours as different structions (should obviously be changed in MEVIS draw)
  • export as DICOM slices worked, but window settings no longer made sense
  • brush size could be more convenient in screen coordinates
• Hans worked out a successful way of exporting SEG objects from MeVisLab
  • needs to be integrated in next versions of MEVIS draw
  • remaining problem with odd height of segmentation masks (odd widths were fixed previously, but height still seems to be a problem)
    • can be worked around by padding, though
  • import in Slicer had problems in stable version, but worked nicely with nightly build (with improved DICOM database)
  • import in public MITK version did not work at all, but Marco could get it to run with a developer version

Illustrations